发明名称 TWO-CRYSTALS X-RAY SPECTROSCOPE
摘要 PURPOSE:To improve the reading accuracy of an exit X-ray wavelength by controlling the rotating means of 1st and 2nd flat plate type spectral crystal and the moving means of a 2nd flat plate type spectral crystal by using the results of the measurements by an exit X-ray intensity meter and detected X-ray intensity meter. CONSTITUTION:The X-ray having the continuous spectra generated from an X-ray source 1 are projected through an X-ray route 8 to the 1st spectral crystal 2 by which only the X-ray having the wavelength satisfying the Bragg conditions is diffracted and the other X-rays are absorbed in the crystal 2. The diffracted X-ray is again diffracted by the 2nd spectral crystal 3 and is guided to an X-ray route 9. This X-ray transmits the exit X-ray intensity meter 4 and transmits a standard sample body 5, from which the X-ray is guided to the transmitted X-ray intensity meter 6. A stage 12 on which the crystal 3 is imposed is moved by means of a ball screw 14 introduced from a 2nd crystal moving motor 13 consisting of a stepping motor on the outside of a container 7 of the two-crystals X-ray spectroscope into the container 7 via a magnetic fluid seal. Spectral crystal rotating motors 10, 15 and the motor 13 are driven when step numbers are inputted to drivers 18, 19 and controller 17 for the respective drivers 18, 19 through a controller 20.
申请公布号 JPS6488399(A) 申请公布日期 1989.04.03
申请号 JP19870247056 申请日期 1987.09.30
申请人 HITACHI LTD 发明人 ABE OSAMU
分类号 G01N23/00;G21K1/06 主分类号 G01N23/00
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