| 摘要 |
PURPOSE:To generate a test pattern efficiency and test a logic circuit by dividing the circuit advantageously to the generation of the test pattern and then constituting a scan path. CONSTITUTION:Input connection data 101 having no scan path is divided into plural partial circuits by circuit division 102 and the scan path is constituted 104 according to the division information 103 to generate connection data 105 including the scan path. The arrangement of the circuit, the layout 106 of wiring, etc., and the generation 108 of the test pattern are performed by using the data and layout data 107 and test pattern 109 are generated with them. Thus, the scan path constitution is performed after the advantageous circuit division for the generation of the test pattern to improve the generation efficiency of the test pattern, thereby shortening the measurement time of an actual circuit test. |
