| 摘要 |
<p>Built-in test equipment performs time out tests on a plurality of fast lines and a plurality of slow lines with respect to a short time interval and a long time interval respectively. The fast inputs are multiplexed (11) under control of a first sequencing counter (23) and the slow inputs are multiplexed (15) under control of a second sequencing counter (28). The counter outputs set up logic (18) so as to differentiate the error status with respect to the lines. Additional counters (22,27) sequence the logic through the operations to be performed on the lines and are utilised to clock the sequencing counters.</p> |
