发明名称 Integral transducer structures employing high conductivity surface features
摘要 A semiconductor transducer structure is fabricated by utilizing varying height diffused layers in a sacrificial wafer. A carrier wafer has a dielectric layer on a top surface which includes a layer of glass. The sacarificial wafer, after beign subject to diffusion of highly doped semiconductor material, exhibits a plurality of varying depth regions. These regions manifest the basic transducer structure. By utilizing selective etching, one can thus form a transducer structure on the sacrificial wafer which is bonded to the carrier wafer by means of an electrostatic bond. The resultant method and structure enables one to provide transducers with improved operating characteristics which are adaptable for many different modes of operation.
申请公布号 US4814856(A) 申请公布日期 1989.03.21
申请号 US19860860523 申请日期 1986.05.07
申请人 KULITE SEMICONDUCTOR PRODUCTS, INC. 发明人 KURTZ, ANTHONY D.;NUNN, TIMOTHY A.;WEBER, RICHARD A.
分类号 G01L9/00;H01L27/20;(IPC1-7):H01L27/20 主分类号 G01L9/00
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