发明名称 MANUFACTURE OF THIN FILM FIELD EFFECT TYPE TRANSISTOR
摘要 <p>PURPOSE:To reduce the step of a gate electrode and to prevent a linear defect and a display irregularity from being generated by etching the projection part of an insulating film formed on an amorphous silicon layer by using a metallic film as a mask, and forming the gate electrode on a flattened insulating film. CONSTITUTION:A source electrode 3 and a drain electrode 2 are formed on a glass substrate 1, the amorphous silicon layer 4 is so formed on the source electrode 3 and drain electrode 2 as to connect the source electrode and drain electrode 2, and an insulating film 5 and the metallic film 6 are formed in order over the entire surface including the amorphous silicon layer 4. Then the projection-shaped metallic film 6 formed on the amorphous silicon layer 4 is removed, the remaining metallic film 6 is used as the mask to etch and flatten the insulating film 5, and the gate electrode 7 is formed on the flattened insulating film 5. Consequently, the step of the gate electrode 7 is made small and when this is used for liquid crystal display, neither of the linear defect and display irregularity is caused.</p>
申请公布号 JPS6473325(A) 申请公布日期 1989.03.17
申请号 JP19870231620 申请日期 1987.09.14
申请人 NEC CORP 发明人 TADOKORO OSAMU
分类号 H01L27/12;G02F1/136;G02F1/1368;H01L21/336;H01L29/78;H01L29/786 主分类号 H01L27/12
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