发明名称 METHOD OF BUILDING UP OXIDE ON ION-IMPLANTED POLYCRYSTALLINE SILICON SURFACE
摘要 PURPOSE: To grow a high-quality oxide on an ion-implanted polysilicon surface by forming an Si film on a substrate, implanting ions therein, activating them to convert the Si film into a polysilicon, growing an insulation layer thereon, implanting second ions through it, removing the insulation layer and growing a second insulation layer. CONSTITUTION: On a substrate 10 an Si film 12 is formed through e.g. an oxide layer 11 and doped with a first dopant, e.g. P which is activated to convert the Si film 12 into a polysilicon 14, a first insulation layer 13 is grown on the polysilicon film 14, this frequency 14 is doped with a second dopant e.g. Ar through the first layer 13, the first layer 13 is removed, and a second insulation layer 15 is grown on the polysilicon film 14 so as to have uniform physical and electrical properties.
申请公布号 JPS6472531(A) 申请公布日期 1989.03.17
申请号 JP19880179321 申请日期 1988.07.20
申请人 INTEL CORP 发明人 HIMANSHIYU CHIYOKUSHI;DANIERU TAN
分类号 H01L21/265;H01L21/316;H01L21/321;H01L21/3215;H01L21/768 主分类号 H01L21/265
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