TESTING APPARATUS OF LSI,申请号JP19870226581-传众专利搜索

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发明名称	TESTING APPARATUS OF LSI
摘要
申请公布号	JPS6469973(A)	申请公布日期	1989.03.15
申请号	JP19870226581	申请日期	1987.09.11
申请人	HITACHI LTD	发明人	YAMAGUCHI KAZUO
分类号	G01R31/317;G01R31/28;G01R31/3183;G06F1/04	主分类号	G01R31/317
代理机构		代理人
主权项
地址

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