| 摘要 |
PURPOSE: To easily obtain high reliability by comparing fault data of a current test with information stored in a knowledge base and updating the knowledge base with information regarding whether or not a recommended correcting method removes a defect. CONSTITUTION: This device includes the knowledge base 26 which stores information regarding the electronic device. Further, the device includes a means 36 which compares current test defect data with the information stored in the knowledge base 26 including past test defect data on similar electronic devices. A means 40 which generates the recommended correcting method is also provided. Lastly, the device includes a means which updates the knowledge base 26 with the information regarding whether or not the recommended correcting method removes the defect. Consequently, high reliability is easily obtained. |
