发明名称 Fracturable x-y storage array using a ram cell with bidirectional shift
摘要 A fracturable x-y random access memory array for performing pushing and popping of data and fracturing the array simultaneously at a common address includes a row fracture circuit responsive to row addresses to fracture the array in the Y-direction and a column fracture circuit responsive to column addresses for fracturing the array in the X-direction. A plurality of memory cells are stacked in a plurality of columns to form an x-y organization which can be randomly accessed in response to the row and column addresses. The memory cells are responsive to a shift control driver circuit for bidirectional shifting of data by either pushing data into or popping data from at any point within one of the plurality of randomly addressable column at the same row and column addresses used to fracture the array defining a fracture point. Data in all of the memory cells in the array with addresses higher (or lower) than the fracture point shift and the memory cells with addresses lower (or higher) than the fracture point maintain their data unchanged.
申请公布号 US4813015(A) 申请公布日期 1989.03.14
申请号 US19860838993 申请日期 1986.03.12
申请人 ADVANCED MICRO DEVICES, INC. 发明人 SPAK, MICHAEL E.;TYL, CRAIG S.;WOTTRICH, PHILIP C.
分类号 G11C7/00;G06F7/78;G11C11/412;G11C19/00;G11C19/28;(IPC1-7):G11C19/00;G11C8/00 主分类号 G11C7/00
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