发明名称 FLAW DETECTION APPARATUS
摘要 PURPOSE:To perform flaw detection with good accuracy without leaving a flaw non- detecting region, by dividing, contacting and separating a flaw detection probe corresponding to the inclination like distribution of the leading and rear end positions of a material to be inspected detected by measuring the positions of the leading and rear ends of said material to be inspected. CONSTITUTION:In a flaw detection apparatus, when there is inclination like distribution at the positions of the leading and rear ends of a material to be inspected due to the configuration inclination or oblique feed of the leading and a rear end parts of a material 1 to be inspected when the leading and rear end parts of the material 1 to be inspected pass detectors 3, 4 for detecting the leading and rear ends of the material 1 to be inspected, difference is generated between the leading and rear end detection timings in the detectors 3, 4 for detecting the leading and rear ends of the material to be inspected. In a tracking processing apparatus 7, the difference between said leading and rear end detection timings is utilized to perform operation and a contact and separation material order is outputted so that the split blocks P1-Pn of a separation and contact material type flaw detection probe 9 successively contact and separate with respect to a probe contact and separation material driving apparatus 8 at the point of time when the leading and rear ends of the material arrive.
申请公布号 JPS6463855(A) 申请公布日期 1989.03.09
申请号 JP19870220779 申请日期 1987.09.03
申请人 MITSUBISHI ELECTRIC CORP 发明人 TACHIKAWA SATORU
分类号 G01N29/04;G01N29/26 主分类号 G01N29/04
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