发明名称 SEMICONDUCTOR LASER DEVICE
摘要 PURPOSE:To always grasp an operating state and to obtain information of maintenance whether it is normal deterioration or abnormality by comparing a monitoring output with one of a plurality of comparison reference values, and sequentially comparing it with other comparison reference value to detect the operating state. CONSTITUTION:It is applied to a semiconductor laser device having an APC circuit including a current limiter to detect a deterioration or an abnormality, for example, in two stages. A first comparison reference voltage V2 is set to a value lower than a monitoring voltage at normal time. When a laser diode 1 is deteriorated to reduce a monitoring voltage V0, the output of a comparator 24 is inverted. The deterioration or abnormality of first stage of the diode 1 is notified to an exterior. A second comparison reference voltage V3 is set to a value lower than the first voltage. When the deterioration of the diode 1 is advanced so that the voltage V0 is further reduced, the output of the comparator 30 is inverted. The deterioration or abnormality of second stage is notified.
申请公布号 JPS6457771(A) 申请公布日期 1989.03.06
申请号 JP19870214710 申请日期 1987.08.28
申请人 SONY CORP 发明人 SAKAMOTO YASUHIRO
分类号 G11B7/125;H01S5/042;H01S5/068 主分类号 G11B7/125
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