| 摘要 |
For temp. regulated testing of electronic components, a control plate (1) has holes (2), and the contact plate (4) has a number of sprung or sprung-fastened pointed contact pins (3) the number of which corresponds to the total quantity of connections on the component (100). The temp. regulated counter plate (6) has good thermic location against the component, and the three plates (1, 4, 6) are connected laterally by a guide column. The parts of the contactor may execute a movement where the component contact underside is freed from mechanical contact with the adjacent and thermally conductive control plate. At the same time, the component is retained between the counter plate and the pointed contact pins, thus ensuring good electrical contact with the component connecting surfaces. |
