| 摘要 |
PURPOSE:To make it possible to shorten determining time to a large extent without analyzing a standard sample in quantitative analysis, by obtaining the relative intensity of X rays for every element from the X-ray intensity of the standard sample and the measured X-ray intensity of an unknown sample. CONSTITUTION:The characteristic X-ray intensities of various standard samples are measured. Namely, at first, the characteristic X-ray intensity of a reference sample, which is a reference sample for X-ray intensity comprising a stable element that is not directly related to an unknown sample, is measured. Then, the X-ray intensity of the standard sample of each element is measured. The ratio between this intensity and the X-ray intensity of the reference sample is obtained. Then, the X-ray intensity of an unknown sample is measured. Namely, at first, the measuring conditions are made the same as the conditions for the standard sample, and the X-ray intensity is measured with the reference sample. Then, the X-ray intensity is measured for each element of the unknown sample. The ratio between the X-ray intensity of the standard sample and the X-ray intensity of the reference sample, which is obtained beforehand, is multiplied by the measured X-ray intensity of the reference sample. Thus, the relative X-ray intensity of each element is obtained without the measurement of the standard sample for the relative X-ray intensity of each element of the standard sample. Correcting computation is performed on the basis of the obtained relative intensity, and the concentration of each element is obtained. |
