发明名称 Semiconductor layer structure having an aluminum-silicon alloy layer.
摘要 A semiconductor layer structure includes an alloy layer (13) of aluminum and silicon formed on a silicon substrate (11). The concentration of silicon contained in the aluminum-silicon alloy layer (13) is within a range of 10 to 75 weight percent. A barrier layer (14) is formed on top of the aluminum-silicon alloy layer, and a metallic layer (15) is formed on top of the barrier layer (14).
申请公布号 EP0305296(A1) 申请公布日期 1989.03.01
申请号 EP19880402162 申请日期 1988.08.25
申请人 FUJITSU LIMITED 发明人 WATANABE, KIYOSHI
分类号 H01L23/532;H01L29/47;(IPC1-7):H01L23/48;H01L29/40 主分类号 H01L23/532
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