发明名称 X-ray examination apparatus with a locally divided auxiliary detector
摘要 X-ray examination apparatus includes a detector array 32 for the detection of the light beam 10. The array is set up in such a manner that image information from substantially the entire output screen of an X-ray image-intensifier tube incorporated in the apparatus can be detected. The detector array is used for brightness control and for adaptation of the quantities influencing the image quality. Use is made of a measured field which can be programmed spatial image imformation can also be used by the matrix form of the detector.
申请公布号 US4809309(A) 申请公布日期 1989.02.28
申请号 US19880173682 申请日期 1988.03.24
申请人 U.S. PHILIPS CORPORATION 发明人 BEEKMANS, ANTONIUS A. G.
分类号 H04N7/18;A61B6/00;G01N23/04;H05G1/26;H05G1/36;H05G1/44;H05G1/64;(IPC1-7):H05G1/64 主分类号 H04N7/18
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