| 摘要 |
The invention relates to a device for measuring mechanical parameters in the vicinity of the surface and/or at the surface of materials. It comprises a framework supporting a first structure for mounting a first sample 3, a second structure for mounting a second sample 4, a first actuator 1 making it possible continuously to move the first structure with respect to the second structure, in order to bring together or move apart, or possibly bring into pressure contact, the first and second samples, and means for measuring the relative displacement of the first and second structures, and the interaction between the two samples. The invention is characterised in that it comprises, mounted in series with the first actuator 1, a second actuator 2 with a vibratory operation introducing an alternating component into the displacement of the first structure. The invention applies to the study of materials. <IMAGE>
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