| 摘要 |
PURPOSE:To vary the shift direction of a semiconductor scanning circuit by means of an external control signal by constituting a flip-flop circuit by 5 sets of field effect transistors FETs and a bootstrap capacitor in a semiconductor scanning circuit having plural flip-flop circuits arranged in a line. CONSTITUTION:A drain 31 of a 1st FET 1 is connected to an output of a flip- flop circuit of pre-stage and the source of the 1st FET is connected to a gate of a 3rd FET 3 and a bootstrap capacitor 6. The source of the 3rd FET is connected to the source of a 2nd FET, the drain of a 4th FET, the drain of a 5th FET 5 and the drain 31 of the 1st FET of a flip-flop circuit of the next stage. The drain of the 2nd FET is connected to the gate of the 3rd FET of a flip-flop circuit of the pre-stage and the sources of the 4th and 5th FETs are connected to a ground line. In connecting the 2nd FET to a conventional shift register in this way, the shift direction of data having been unidirectional in the conventional device is controlled electrically to attain two-way shift. |
