发明名称 MANUFACTURE OF PERMEABLE BASE TRANSISTOR
摘要 PURPOSE:To form a permeable base transistor (PBI) in which parasitic capacitance is reduced, by a method wherein, after a WSix layer of narrow width is formed on the side-wall of a groove, the WSix layer is buried in an epitaxial layer by epitaxial growth. CONSTITUTION:After an N-GaAs layer 2 is formed on an N<+> GaAs layer 1, a groove 10 is formed in the above layer 2 by using a mask G, and then a WSix layer 4 is formed on the whole surface. By etching, the above WSix layer 4 is left only on the side-wall of a lower protruding part. By epitaxial growth of the N-GaAs layer 2, a groove 10 is buried. After the mask 3 is eliminated, the N-GaAs layer 2 is again grown by epitaxy, and thereon an N<+> GaAs layer 5 is formed in succession. Thereby, a narrow side-wall 4A composed of WSix formed on the groove 10 can be made a base electrode, so that a depletion layer 10 around the base electrode 4A takes more roles in PBT operation. Therefore, the parasitic capacitance can be reduced.
申请公布号 JPS6441275(A) 申请公布日期 1989.02.13
申请号 JP19870197668 申请日期 1987.08.07
申请人 NEC CORP 发明人 HONJO KAZUHIKO
分类号 H01L29/68;H01L21/20;H01L29/41;H01L29/772;H01L29/80 主分类号 H01L29/68
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