| 摘要 |
The invention relates to test equipment for vehicle headlights. This test equipment consists of an optics box which can be adjusted in height and is supported by a vertical column in a manner capable of rotation about a vertical axis. The optics box carries the testing devices for measuring the dipped (low, passing) beam. The optical axis of the optics box must extend both parallel to the vertical centre plane of the vehicle and in the optical axis of the headlight. Adjustment with respect to the centre plane of the vehicle is undertaken by a first adjusting device, while the setting of the optical axis of the optics box with respect to the optical axis of the vehicle headlight is undertaken via a second sighting device. This second sighting device consists of two surfaces of which the first, upper surface extends above the positive (collective, converging) lens of the optics box and is constructed as a transparent plate. The second surface extends, such that it can pivot about an axis, below the first axis and in front of the positive lens of the optics box. This second surface extends obliquely downwards, at an angle of approximately 45@, in the direction of the headlight to be tested. This second surface is constructed as a mirror. The two surfaces carry crosswires (crosshairs). If the focuser looks vertically from above on to the crosswires of the first surface, specifically from a direction such that the crosswires of the first surface are covered by the crosswires of the second surface, and if these two crosswires lie ... Original abstract incomplete.
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