| 摘要 |
In an automated high speed test handler for integrated circuits (IC's) an articulated vacuum picker reciprocates to transfer IC's successively from a staging area to a test site. Movable stops position and locate the IC at a test site. A sliding plate mounts the picker and carries cam surfaces to control the stops. A reciprocating placer mechanism carrying a multi-port vacuum manifold carries an IC being tested from the test site to a test plane displaced laterally from the flow path of the device. The picker is balanced to rotate under the weight of the IC being carried against mutually inclined lateral guide rails so that the mechanism is self-centering. These guide and locating mechanisms accurately position the IC so that there is no need for a physical steering of the IC's as they approach the test plane or a separately actuated clamping of the device in the test plane. After testing, the device is stripped from the vacuum manifold as the device encounters a guide plate on the return stroke of the placer mechanism.
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