| 摘要 |
An integrated circuit with a frequency dividing test function includes a first frequency dividing circuit which divides a given frequency signal, a second frequency dividing circuit for dividing the output signal from the first frequency dividing circuit and a single terminal receptive of external test clock pulses. A test circuit is connected to the reset terminal for inhibiting the output signal from the first frequency dividing circuit when the external test clock pulses applied to the reset terminal have a higher frequency than the divided frequency of the first output signal and for applying the external clock pulses to the second frequency dividing circuit to test the second frequency dividing circuit.
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