发明名称 |
MANUFACTURE OF SEMICONDUCTOR DEVICE |
摘要 |
<p>PURPOSE:To prevent a buried-in Al wirings from corroding by a method wherein a protective insulating film is formed not to expose the sides of an underlaid insulating film while a scribing region is regulated within a range not to be formed of the protective insulating film. CONSTITUTION:An interconnection is formed on a semiconductor substrate 1 formed of a semiconductor element on a main surface through the intermediary of a primer insulating film 2. A protective insulating film 4 formed covering the interconnection is divided into multiple chips by scribing process. At this time, the insulating film 4 is formed not to expose the sides of the primer insulating film 2 while a scribing region 6 is regulated within the range not to be formed of the insulating film 4. Through these procedures, step difference parts in contact with the region 6 are covered with the insulating film 4 to prevent the buried-in Al wirings from corroding.</p> |
申请公布号 |
JPS6428827(A) |
申请公布日期 |
1989.01.31 |
申请号 |
JP19870183397 |
申请日期 |
1987.07.24 |
申请人 |
HITACHI LTD;HITACHI MICRO COMPUT ENG LTD |
发明人 |
NAGAI YOSHIKUNI;KINASHI MASAKI;KISHI GUNJI |
分类号 |
H01L21/301;H01L21/312;H01L21/316;H01L21/78 |
主分类号 |
H01L21/301 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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