发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE:To prevent a buried-in Al wirings from corroding by a method wherein a protective insulating film is formed not to expose the sides of an underlaid insulating film while a scribing region is regulated within a range not to be formed of the protective insulating film. CONSTITUTION:An interconnection is formed on a semiconductor substrate 1 formed of a semiconductor element on a main surface through the intermediary of a primer insulating film 2. A protective insulating film 4 formed covering the interconnection is divided into multiple chips by scribing process. At this time, the insulating film 4 is formed not to expose the sides of the primer insulating film 2 while a scribing region 6 is regulated within the range not to be formed of the insulating film 4. Through these procedures, step difference parts in contact with the region 6 are covered with the insulating film 4 to prevent the buried-in Al wirings from corroding.</p>
申请公布号 JPS6428827(A) 申请公布日期 1989.01.31
申请号 JP19870183397 申请日期 1987.07.24
申请人 HITACHI LTD;HITACHI MICRO COMPUT ENG LTD 发明人 NAGAI YOSHIKUNI;KINASHI MASAKI;KISHI GUNJI
分类号 H01L21/301;H01L21/312;H01L21/316;H01L21/78 主分类号 H01L21/301
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