发明名称 |
SELECTIVE FORMATION OF SILICON DIOXIDE FILM |
摘要 |
PURPOSE:To selectively form a silicon dioxide film having high working accuracy at a low production cost when an aq. hydrosilicofluoric acid soln. contg. silicon dioxide in a supersatd. state is brought into contact with a base material to deposit a silicon dioxide film on the surface of the base material, by forming a patterned mask of an org. substance on the surface of the base material before the contact. CONSTITUTION:An aq. hydrosilicofluoric acid soln. contg. silicon dioxide in a supersatd. state as a treating soln. is brought into contact with a base material to deposit a silicon dioxide film on the surface of the base material. At this time, a patterned mask of an org. substance is formed on the surface of the base material and the base material is brought into contact with the treating soln. The org. substance is preferably photosensitive resin and patterning is preferably carried out by photolithography from the viewpoint of working accuracy. |
申请公布号 |
JPS6425986(A) |
申请公布日期 |
1989.01.27 |
申请号 |
JP19870181458 |
申请日期 |
1987.07.21 |
申请人 |
NIPPON SHEET GLASS CO LTD |
发明人 |
AIDA TAKUJI;MUGINUMA AKIMITSU;KAWAHARA HIDEO |
分类号 |
C03B19/00;C03C15/00;C03C17/02;C23C18/00;H01L21/768 |
主分类号 |
C03B19/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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