发明名称 INSPECTING DEVICE FOR SURFACE RADIOACTIVE CONTAMINATION
摘要 PURPOSE:To shorten a measurement and processing time and to facilitate storage control over measurement data by sampling a radioactive material sticking on the surface of a body to be inspected and measuring the radioactivity of the sampled material continuously, and storing the measurement data in a storage element. CONSTITUTION:When a radioactive contaminated material sampling member 4 drawn out by a take-up device 5 reaches a contaminated material sampling place, an extender 6 extends to press a sampling member compressor 9. The member 4 coated with a cohesive material samples a radioactive material sticking on the surface of the body 1 to be inspected. Then the take-up device 5 stops when the member 4 comes to in front of a small-sized semiconductor detector 7, and then the radiation of the radioactive material is measured by the detector 7. The output of the detector 7 is amplified and waveform-shaped by a linear amplifier put hermetically in a radiation measuring circuit 8 and a trailing-stage counter to which only a radiation signal larger than a desired crest value is sent through a discriminator counts the radiation signal and transfers the result to a computing element 10. The computing element 10 performs specific arithmetic and stores the radiation intensity measurement result on, for example, an IC card 12 in a storage driving device 11.
申请公布号 JPS6423189(A) 申请公布日期 1989.01.25
申请号 JP19870178922 申请日期 1987.07.20
申请人 HITACHI LTD 发明人 KONDO MASAHIRO;IZUMI SHIGERU;KITAGUCHI HIROSHI;KAWASAKI SATOSHI
分类号 G01T1/169 主分类号 G01T1/169
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