发明名称 Wall thickness measurement apparatus.
摘要 <p>A capacitive probe (49; 304) for a wall thickness detector (50; 302) comprises a plurality of flexible capacitive elements (84, 86) and an elastomeric body (80; 312) supporting the flexible capacitive elements and biasing them against a dielectric body (15) at an inspection site (10; 300). A first metallic shield (380) is supported between the elastomeric body and the capacitive elements and a second metallic shield (76) is supported on the other side of the capacitive elements in close proximity thereto and has a window (81) to expose the capacitive elements to the dielectric member.</p>
申请公布号 EP0300616(A1) 申请公布日期 1989.01.25
申请号 EP19880305578 申请日期 1988.06.17
申请人 EMHART INDUSTRIES, INC. 发明人 SCOTT, PAUL F.;BUTTON, DONALD C.;REEVES, CHARLES B.;HOWERTER, EDWARD D.
分类号 G01B7/06;B07C5/12;B07C5/34;G01R27/26 主分类号 G01B7/06
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