MICROWAVE MEASURING METHOD AND DEVICE FOR THE CONTACTLESS AND NON-DESTRUCTIVE TESTING OF PHOTOSENSITIVE MATERIALS,申请号EP19850730027-传众专利搜索

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发明名称	MICROWAVE MEASURING METHOD AND DEVICE FOR THE CONTACTLESS AND NON-DESTRUCTIVE TESTING OF PHOTOSENSITIVE MATERIALS
摘要
申请公布号	EP0155225(A3)	申请公布日期	1989.01.25
申请号	EP19850730027	申请日期	1985.02.26
申请人	HAHN-MEITNER-INSTITUT BERLIN GESELLSCHAFT MIT BESCHRANKTER HAFTUNG	发明人	TRIBUTSCH, HELMUT, PROF. DR. RER. NAT.;BECK, GERHARD, DR.-ING.;KUNST, MARINUS, DR.-ING.
分类号	G01R31/26;G01N22/00;G01R31/302;(IPC1-7):G01N22/00	主分类号	G01R31/26
代理机构		代理人
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