发明名称 |
Integrated circuit with improved monitoring function by use of built-in elements |
摘要 |
A semiconductor integrated circuit of the type having at least one reference element fabricated on a semiconductor chip on which functional elements are formed is obtained by a high integration structure. The reference element is coupled through a switching element to a bonding pad to which a part of the functional elements is connected. The switching element assumes a non-conductive state when the functional elements operate and a conductive state when a voltage applied thereto is outside the normal operating voltage of the functional elements.
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申请公布号 |
US4800418(A) |
申请公布日期 |
1989.01.24 |
申请号 |
US19850773060 |
申请日期 |
1985.09.06 |
申请人 |
NEC CORPORATION |
发明人 |
NATSUI, YOSHINOBU |
分类号 |
H01L21/822;G01R31/26;H01L21/66;H01L23/544;H01L27/04;(IPC1-7):H01L23/48 |
主分类号 |
H01L21/822 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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