| 摘要 |
Reflectance apparatus is disclosed for obtaining measurement of nonspecular reflected light in which controlled light rays are directed along a transmission path from a light source (32) through a plurality of light traps (44) to expose or illuminate a specimen and nonspecular reflected light is passed from the specimen (42) through the light traps (44) along a transmission path to one or more detectors (36) where the nonspecular reflected light is measured, the detector's field of view being larger than the illuminated area of the specimen (42) over a wide range of specimen to source (32) and detector (36) distances. |
