| 摘要 |
The proposed method is suitable for monitoring the controllable semiconductor components (T1A...T6A, T1B...T6B) of a converter (U), which has a plurality of main paths, for blocking capability. A precondition in this case is that the drive unit (trigger equipment) (5) of the converter produces short triggering pulses which, as main pulses, trigger the respectively associated semiconductor components and, as subsequent pulses, at the same time trigger the cylically preceding semiconductor components. In the event of an overcurrent being connected in the converter, or after the occurrence of such an overcurrent in the converter, a semiconductor component test is carried out to determine whether any of the semiconductor components have failed, by enabling only the main pulses in the switching-on sequence, while all the subsequent pulses are at the same time inhibited. In the event of an actual current value (iist) being formed by only the main pulses, a defect message (M) is emitted. Furthermore, the pulse position of the main pulses can be shifted in the direction of rectifier operation until fuse action takes place at the location of the failed semiconductor component. <IMAGE>
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