发明名称 AUTOMATIC DESIGNING DEVICE FOR TEST ITEM OF WITH TEST LEVEL DESIGNATING FUNCTION
摘要 PURPOSE:To reduce immense man-hours due to manual selection of actually executable test items by designating a test level of each function to select actually executable test items in consideration of the degree of importance of the function or the like. CONSTITUTION:A test item designing means 4 and a test level information register means 8 are provided, and the means 4 combines respective states of factors on the basis of information registered by a function factor information register means 2 to design test items and registers designed test items in a test item file 5, and the means 8 registers a ratio of the number of selected test items in a test level information register file 9 on the basis of information displayed by a test item display means 6. A test item selecting means which selects the test items from the test item file 5 on the basis of registered test level information and registers them in a selected test item file 11 and the test item display means 6 which displays selected test items from the selected test item file 11 are provided. Thus, the man-hours are reduced to select the test items in accordance with the degree of importance.
申请公布号 JPS6413639(A) 申请公布日期 1989.01.18
申请号 JP19870170063 申请日期 1987.07.07
申请人 NEC CORP 发明人 MANO TOSHIKI
分类号 G06F11/22 主分类号 G06F11/22
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