| 摘要 |
<p>PURPOSE:To satisfy product catalog requirements even by performing access time check at the time shipping test in the erased state by selecting the readout access time of memory information in the erased state as the maximum access time. CONSTITUTION:An address switching detection circuit 2 sets a sense amplifier circuit 5 and an output buffer circuit 6 so as to have a memory information output in the latest write state of the access time in the voltage level. Thus, even in the address access time when the selected memory information is switched from '1' to '1' is read once through the level '0' and the address access time is used as the maximum access time. Since the readout address access time in the erased state, that is, when all bits are logical 1 is set to the maximum access time without fail, the access time test satisfying the requirement of the product catalog is executed by only the access time check in the erased state.</p> |
