发明名称 |
Shadow detecting optical micrometer. |
摘要 |
<p>Dimension, surface condition and configuration related information may be accurately determined by positioning the object to be measured or counted between an array of photoresponsive elements and a lens, said lens adapted to receive divergent rays of light from a source located at the focal point thereof and collimatingly direct those rays toward said array. The shadow of the object may thereby be accurately measured by said array.</p> |
申请公布号 |
EP0298588(A1) |
申请公布日期 |
1989.01.11 |
申请号 |
EP19880304178 |
申请日期 |
1988.05.09 |
申请人 |
OVONIC IMAGING SYSTEMS, INC. |
发明人 |
VALA, JOHN D. |
分类号 |
G01B11/02;G01B11/24;(IPC1-7):G01B11/24 |
主分类号 |
G01B11/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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