发明名称 Shadow detecting optical micrometer.
摘要 <p>Dimension, surface condition and configuration related information may be accurately determined by positioning the object to be measured or counted between an array of photoresponsive elements and a lens, said lens adapted to receive divergent rays of light from a source located at the focal point thereof and collimatingly direct those rays toward said array. The shadow of the object may thereby be accurately measured by said array.</p>
申请公布号 EP0298588(A1) 申请公布日期 1989.01.11
申请号 EP19880304178 申请日期 1988.05.09
申请人 OVONIC IMAGING SYSTEMS, INC. 发明人 VALA, JOHN D.
分类号 G01B11/02;G01B11/24;(IPC1-7):G01B11/24 主分类号 G01B11/02
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