发明名称 Semiconductor memory device having non-volatile memory transistors.
摘要 <p>A semiconductor memory device having a redundancy memory cell array is disclosed. UV-PROM's are employed as a programming means in the redundancy control section. A first impurity region (17) is formed in the substrate (1) and the control gate electrode (61) of the UV-PROM is led out through the first impurity region. A second impurity region (76) is formed in the substrate (1) and crosses the first impurity region, and the floating gate electrode (12) of the UV-PROM is covered by a metallic film which is contacted to the second impurity region.</p>
申请公布号 EP0298489(A2) 申请公布日期 1989.01.11
申请号 EP19880110893 申请日期 1988.07.07
申请人 NEC CORPORATION 发明人 IWASHITA, SHINICHI
分类号 H01L21/82;H01L21/8246;H01L21/8247;H01L27/112;H01L29/788;H01L29/792 主分类号 H01L21/82
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