| 摘要 |
PURPOSE:To exactly measure the laser light absorptivity of a sample by receiving the IR rays from a part of a measuring sample except the laser light path thereof in an IR element by an IR optical system and measuring the temp. change of the sample. CONSTITUTION:A part subjected to a high-emissivity coating 2 is provided to the part, for example, side face of the measuring sample except the laser light path thereof. The IR rays from the central part 4 of the coating 2 are focused on the surface of the IR element 5 by the IR optical system 3 provided to face said part. The IR rays of the wavelength corresponding to the temp. of the sample 1 are kept radiated from the sample 1. The temp. measurement without contact is made by measuring the wavelength of the IR rays by a temp. analyzer 6 connected to the element 5. The measured temp. is inputted to a computer 7 and the laser light absorptivity of the sample inputted to the computer 7 is calculated. The laser light absorptivity of the measuring sample is thereby exactly measured. |
