发明名称 Plasma treating method and apparatus therefor
摘要 This invention relates to a plasma treating method and apparatus therefor. The plasma treating method comprises rendering a gas having a critical potential plasmic under a reduced pressure and changing an acceleration voltage for accelerating ions in the plasma towards a sample interposing the critical potential. The plasma treating apparatus comprises means for rendering a gas having a critical potential plasmic under a reduced pressure and means for changing an acceleration voltage for accelerating ions in the plasma towards a sample interposing the critical potential. According to the present invention, the etching step and the film formation step can be carried out alternately and the plasma treating time can be shortened.
申请公布号 US4795529(A) 申请公布日期 1989.01.03
申请号 US19870109318 申请日期 1987.10.19
申请人 HITACHI, LTD. 发明人 KAWASAKI, YOSHINAO;KAWAHARA, HIRONOBU;KAKEHI, YUTAKA;HIROBE, KADO;KUDO, KATSUYOSHI
分类号 H05H1/02;C23C16/517;H01J37/32;H01L21/302;H01L21/3065;(IPC1-7):H01L21/306;B44C1/22;B05D3/06;C23C14/00 主分类号 H05H1/02
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