发明名称 POWER SUPPLY ON/OFF FUNCTION TEST SYSTEM FOR LOGICAL DEVICE
摘要 PURPOSE:To realize an automatic power supply ON/OFF function test by storing information obtained before a power supply stops supply of a working voltage and continuing said function test based on said information after the supply of the working voltage is restarted. CONSTITUTION:A memory means 131 stores the information obtained before a power supply 121 stops the supply of the working voltage and maintains this information after the supply of the working voltage is stopped. An instruction is sent to the power supply 121 from a processing means 111 for execution of a power supply ON/OFF function test. Then the power supply 121 stops and restarts the supply of the working voltage for a logical device. Then said function test is continued based on information stored in the means 131. Thus the function test is continued based on the information stored in the means 131 after the power supply 121 restarts the supply of the working voltage. In such a way, said function test is automated.
申请公布号 JPS63311446(A) 申请公布日期 1988.12.20
申请号 JP19870146466 申请日期 1987.06.12
申请人 FUJITSU LTD 发明人 TAKEMATA SHINICHI
分类号 G06F1/26;G06F1/00;G06F11/22 主分类号 G06F1/26
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