发明名称 FIELD-EFFECT SEMICONDUCTOR DEVICE
摘要 PURPOSE:To make the mutual conductance gm larger by a method wherein an i-type InGaAs channel layer and a carrier feeding layer consisting of a distorted super lattice of AlAs/AlInAs containing impurity are formed are formed on an InP substrate. CONSTITUTION:A channel layer (channel layer 2 consisting of In0.53Ga0.47As) of i-type InGaAs formed on a substrate of InP (substrate 1 of InP), and a carrier feeding layer [electron feeding layer 3 of a distorted super lattice (super doped structure) consisting of AlAs/n-In0.52Al0.48As] consisting of AlAs(AlAs layer) and InAlAs containing impurity (n-type In0.53Al0.48 layer) formed on the channel layer are provided. Therefore, a gap is made to be wide in effect and the band discontinuity between the channel layer consisting of In0.53Ga0.47As and the carrier feeding layer is made to be larger, so that higher carrier concentration ns can be obtained. By these processes, the mutual conductance gm can be made to be high.
申请公布号 JPS63311772(A) 申请公布日期 1988.12.20
申请号 JP19870146216 申请日期 1987.06.13
申请人 FUJITSU LTD 发明人 ISHIKAWA TOMONORI
分类号 H01L29/201;H01L21/20;H01L21/338;H01L29/778;H01L29/812 主分类号 H01L29/201
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