| 摘要 |
The invention relates to a novel design of a grid matching adaptor (12) for a circuit board tester. The grid matching adaptor (12) is intended to make it possible to test the test points of a circuit board (26) to be tested, which are arranged at a smaller grid spacing, with test probes (5, 39) which have a wider grid spacing. For this purpose, the test probes (5, 39) are arranged in two separate test probe grid panels (6, 11). The grid spacing is now reduced along a grid coordinate (x) due to the test points (23) of in each case two adjacently located test point rows of the test point grid panel (38) being connected to the test contacts (5, 39) of test contact rows of the in each case other test contact grid panel (6, 11). This is implemented by a single packet of circuit boards A, B; C which are located next to each other but are insulated from one another and which are provided at one end face with output contacts (15; 114, 115) and two other mutually opposite end faces with input contacts (13, 14; 112, 113). The end faces provided with the input contacts face the two separate test contact grid panels (6, 11). <IMAGE>
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