发明名称 PROBE SCANNING ARRANGEMENT
摘要 A tip-scanning mechanism for use in a scanning tunneling microscope uses three drivers for driving a probe tip in three perpendicular directions. The drivers each consist of a piezoelectric element. In accordance with the invention, these three drivers are each shaped into a sheet, and the three sheets are stacked on top of each other. Two of the three drivers produce strains parallel to both faces of the drivers when a voltage is applied across the faces of each driver. Thus, rapid scans can be made without producing distortion.
申请公布号 GB2205680(A) 申请公布日期 1988.12.14
申请号 GB19880007163 申请日期 1988.03.25
申请人 * RION CO LTD;* JEAL LTD 发明人 KIMIO * OHI;KAZUMA * SUZUKI;KIYOSHI * MIYASHITA;MASASHI * IWATSUKI
分类号 G01B7/34;G01N23/00;G01N27/00;G01N37/00;G01Q10/04;G01Q60/10;H01J37/28;H01L41/083;H01L41/09;(IPC1-7):H01J37/20;H02N2/00;H01J37/02;H01J37/26;H01L41/00 主分类号 G01B7/34
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