发明名称 Test socket with improved contact engagement.
摘要 <p>A test socket has movable contact elements blanked from sheet metal to provide each element with a mounting leg part, a contact part at an edge of the blanked sheet metal, and a resilient curved part between the leg and contact parts permitting the contact part to be moved into and out of engagement with terminals of an IC unit to be tested in the socket and has a plurality of projections formed in side-by-side relation to each other in the edge of the sheet metal at the contact part for improving the making and breaking of electrical connection to the IC unit terminal.</p>
申请公布号 EP0295046(A1) 申请公布日期 1988.12.14
申请号 EP19880305174 申请日期 1988.06.07
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 IKEYA, KIYOKAZU
分类号 H01R33/74;G01R31/28;H01L23/32;H01R33/76;H05K7/10;(IPC1-7):H05K7/10 主分类号 H01R33/74
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