发明名称 Coplanarity testing device for surface mounted components.
摘要 <p>The testing device checks the coplanarity of the leads (14) of a surface mounted component (12) on a plane defined by the three longest leads of the component. The device comprises first and second conductive plates (20, 26) separated by a non-conductive spacer (24) and conductive spring means (24) having arms (28) providing electrical connections between the plates (20, 26). One of the plates (20) carries a plurality of non-conductive pins (16) associated with the arms (28). When the leads (14) of a component (12) are applied to the pins (16) the arms (28) associated with pins (16) contacted by leads (14) having coplanarity within the thickness of the spacer-means (24) break their connections between the plates (20, 26) while any connections remaining are indicated by an earthed indicator means (30).</p>
申请公布号 EP0294925(A2) 申请公布日期 1988.12.14
申请号 EP19880303332 申请日期 1988.04.13
申请人 ALLTEQ INDUSTRIES 发明人 CHIPONIS, LAWRENCE J.
分类号 G01B7/00;G01B7/287;G01B7/34;G01R31/00;H01L21/66 主分类号 G01B7/00
代理机构 代理人
主权项
地址