| 摘要 |
PURPOSE:To enhance the detection accuracy of scattering beam without increasing the number of scattering beam detectors and to prevent the generation of an artifact, by calculating not only a scattering beam expanse function but also a curve showing a tendency of scattering beam and calculating the ratio of main detector data and scattering beam data to prepare correction data. CONSTITUTION:A scattering beam expanse function f(x) is calculated to be stored in a memory means along with a constant K. The constant K means that the K H in the output of a main detector 2 is scattering beam, when the output of a scattering beam detector is H. Scanning is performed in such a state that an object P to be examined is arranged to obtain main data Rm(x) and scattering beam data Sm. Convolution data R'm(x) is obtained from the relation between Rm(x) and f(x) by a convolver 7 to calculate a ratio X for shifting the data R'm(x). The data R'm(x) is multiplied by the ratio X by a multiplier 9 to calculate correction data S'm(x). The correction data Sm(x) is subtracted from the data Rm(x), which is obtained by the main detector, by subtractor 10 to calculate real data R''m(x). |
