发明名称 TESTER PROBE ADAPTER
摘要 PURPOSE:To prevent a contact position from being dislocated when a point to be tested is a terminal for lapping, by providing an insertion hole having a guide projection for inserting a probe of a tip part of a tester probe, on one end of a metal for extension, and providing a recessed surface part on the other end. CONSTITUTION:On one end of the metal 1 for extension, an insertion hole 12 for inserting the probe of the tip of a tester probe is provided, and on this insertion hole 12, a guide projection 13 is provided. Also, on the other end of the metal 1 for extension, a recessed surface part 11 is provide. A cylindrical insulator 2 is screwed to the periphery of the metal 1 for extension being adjacent to the recessed surface part 11. The insertion hole 12 is inserted into a metal rod 21, the guide projection 13 is fitted into a guide groove 22 and against the tester probe, the rotation of a tester probe adaptor is prevented. In such a way, it is prevented that the insulator 2 provided on the outer periphery of the metal 1 for extension is brought into contact with the adjacent terminal, and the recessed surface part 11 of the tip part suppresses the dislocation of a contact position, therefore, a stable contact is obtained.
申请公布号 JPS63304170(A) 申请公布日期 1988.12.12
申请号 JP19870140803 申请日期 1987.06.04
申请人 NEC CORP 发明人 NARUSE MASAYA
分类号 G01R1/06 主分类号 G01R1/06
代理机构 代理人
主权项
地址