发明名称 Method for measuring dimensions of fine pattern
摘要 A method for measuring the dimensions of a fine pattern, comprises first measuring a surface area and determining a profile of a displayed pattern image, second, calculating the center of gravity of the pattern image, third, calculating an equivalent diameter of a circular pattern having the same surface area as the pattern image, fourth, calculating a mean value of pattern lengths of lines which all pass through the center of gravity of the pattern image and which intersect the pattern image at two intersecting points; and fifth, comparing the mean value with the equivalent diameter of the circular pattern image. The pattern lengths are defined as distances between the two intersecting points.
申请公布号 US4790023(A) 申请公布日期 1988.12.06
申请号 US19870023493 申请日期 1987.03.09
申请人 FUJITSU LIMITED 发明人 MATSUI, SHOUGO;KOBAYASHI, KENICHI
分类号 G01B11/02;(IPC1-7):G06K9/46 主分类号 G01B11/02
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