| 摘要 |
PURPOSE:To permit a fine amount of a specimen to be measured, by providing a drive mechanism for changing an aperture of a collector slit in association with an electric field voltage and widening the aperture when metal stable ions are measured as compared with a case wherein parent ions are measured. CONSTITUTION:Ions from an ion source 1 are converged into a collision activation chamber 6 and metal stable ions (daughter ions) produced by cleavage and parent ions passing through are separated in an electric field 8. Then, ions passing through a collector slit 9 are detected by an ion detector 10. The slit 9 is driven by a pulse motor 15 and the motor 15 is controlled by a CPU 14 through a controller 14. An aperture of the slit 9 is changed in accordance with a measuring ion determined by an electric field voltage and is widened when the daughter ions are measured as compared with a case wherein the parent ions are measured. With the arrangement, the daughter ions can be measured at a high sensitivity and a fine amount of a specimen can be measured.
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