发明名称 |
MANUFACTURE OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE:To grow a W film having an excellent adhesion to SiO by a method wherein an SiO2 film is formed on the main surface of a semiconductor substrate and W is grown on the above SiO2 film by CVD under the condition that Hg lamps are irradiated. CONSTITUTION:An SiO2 film 2 is formed, an Si substrate 1 performed a patterning at need is put in an Hg lamp irradiation type CVD unit and a CVD of W is executed using WF6+H2 as source gas under the condition that Hg lamps are irradiated. The peak wavelengths of the Hg lamps 21 are 253 and 104 nm and ones having a power of 0.5-2 kW are used as the Hg lamps. A heating part 30 is constituted of such heaters as halogen lamps and heats wafers 5 at a temperature of 250-700 deg.C. The interior of a chamber 10 is evacuated through discharge tubes 12 and 13 to reduce the pressure in the interior to pressure close to a CVD growth pressure subsequent to the evacuation. It is desirable that the CVD growth pressure is 0.2-2.0 torr. It is desirable that irradiation is continuously irradiated.
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申请公布号 |
JPS63299249(A) |
申请公布日期 |
1988.12.06 |
申请号 |
JP19870131730 |
申请日期 |
1987.05.29 |
申请人 |
FUJITSU LTD |
发明人 |
INOUE SHINICHI;WATABE TAKUYA;OBA TAKAYUKI |
分类号 |
H01L21/3205;H01L21/28;H01L21/285 |
主分类号 |
H01L21/3205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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