发明名称 |
Via in a planarized dielectric and process for producing same |
摘要 |
An improved integrated circuit structure is disclosed wherein a first metal layer is coated with a dielectric material and another metal layer is applied over the dielectric layer and a via electrically interconnects at least a portion of the first metal layer with at least a portion of the second metal layer. The via is formed having a lower first width dimension adjacent the first metal layer and an upper enlarged width portion adjacent the second metal layer formed by masking the dielectric with a mask having an opening conforming to the first dimension and isotropically etching the dielectric through the mask to provide the enlarged portion adjacent the upper surface of the dielectric.
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申请公布号 |
US4789760(A) |
申请公布日期 |
1988.12.06 |
申请号 |
US19850728962 |
申请日期 |
1985.04.30 |
申请人 |
ADVANCED MICRO DEVICES, INC. |
发明人 |
KOYAMA, LINDA J.;THOMAS, MAMMEN;LEVINSON, HARRY J. |
分类号 |
H01L21/3205;H01L21/311;H01L21/768;(IPC1-7):H05K1/00 |
主分类号 |
H01L21/3205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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