发明名称 DEVELOPING TREATMENT METHOD
摘要 PURPOSE:To obtain a sharp resist pattern profile in a short time, by controlling the concentration of a developer and the developing speed by the use of temperature and pressure of the developer and the developer itself. CONSTITUTION:EBR-9 is spin-coated as an electron beam resist. The EBR-9 is a resist with which a very excellent resist pattern profile can be obtained by reducing the dosage of electron beam and increasing the developing time. After electron beam exposure of the EBR-9, it is contained in a carrier and placed at a loader side. The carrier is conveyed in a developer tank 21, and a semiconductor substrate is developed with a developer 22. The temperature of the developer 22 is changed, the concentration is kept constant, and the developing speed is always kept constant. Then the carrier is put in a rinsing liquid tank. Thereby, a sharp resist pattern profile can be obtained in a short time.
申请公布号 JPS63299337(A) 申请公布日期 1988.12.06
申请号 JP19870135018 申请日期 1987.05.29
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 HASHIMOTO KAZUHIKO;UENO ATSUSHI;NOMURA NOBORU
分类号 H01L21/30;G03F7/00;G03F7/30;H01L21/027 主分类号 H01L21/30
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