发明名称 TEST EQUIPMENT FOR SEMICONDUCTOR DEVICE
摘要 PURPOSE:To allow the user to easily and quickly revise a program by storing a control item possibly to be revised by the user side as the kind or the like into a special storage device as a routine program written in a high-class language. CONSTITUTION:A device program decided depending on the kind of the device is stored in a 1st device program storage device 22 for program storage controlled by a microprocessor 21 and it is described by a high-class language. A program as to the data processing based on the control item changed depending on the hardware of the test equipment, the operation control of a prober including a waver end and rod end, data transfer, collection of result of test and the result of collection of total sum is stored in a 2nd routine program storage device 23 as the utility. An execution routine program such as an interpreter being a specific content to the test equipment is stored in a 3rd execution routine storage device 24. Thus, the program revision attended with the device kind, expansion of test equipment or improvement is facilitated.
申请公布号 JPS63298900(A) 申请公布日期 1988.12.06
申请号 JP19870133668 申请日期 1987.05.29
申请人 TOSHIBA CORP 发明人 TSUKAGOSHI HISAO;MIYAZAKI TSUTOMU
分类号 G01R31/28;G11C29/00;G11C29/56 主分类号 G01R31/28
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