发明名称 TWO-GRADE PLATE SAMPLING SYSTEM
摘要 PURPOSE:To improve yield by detecting the size and position of a defect present in a ribbon-shaped glass plate by a discrimination type defect detector, and sorting glass plates which are cut into high-grade products and low-grade products by a controller and also sampling them at the same time. CONSTITUTION:When the ribbon-shaped plate which is drawn out of a furnace is conveyed on a line conveyor 100 to the discrimination type defect detector 101, the detector 101 sends defect data on the size and position of the defect to the controller 102. A trimmer 103 draw trimmer lines in parallel to the running direction of the glass plate and an oblique cutter 104 makes cutter lines at right angles to the running direction. A breaker 105 breaks the plate into a glass plate array along the cutter line, and the plate passes through an edge cutting device 106 and is divided into plural pieces along the trimmer lines by a cutting device 107. Then they are expanded by an expanding device 108 at right angles to the running direction and a selective rejection device 109 rejects a defective plate through the decision making of the controller 102. The remaining high-grade products and low-grade products are sorted by plate sampling machines 110-1-110-6.
申请公布号 JPS63298036(A) 申请公布日期 1988.12.05
申请号 JP19870131522 申请日期 1987.05.29
申请人 NIPPON SHEET GLASS CO LTD 发明人 OKAFUJI MASAHARU;KURASHINA ISAO
分类号 G01N21/89;B07C5/36;B65H43/00;C03B33/02;C03B33/037;G01N21/896 主分类号 G01N21/89
代理机构 代理人
主权项
地址